4 kHz non-contact edge and width measurement for inline control A high-speed through-beam optical sensor for non-contact edge position, width and alignment measurement.
COMPONENT
Sub-micron distance and thickness sensing for difficult surfaces A spectral-confocal sensor family for precise distance and thickness measurement without touching the target.
Low-noise scientific imaging for demanding low-light research A cooled scientific CMOS camera family for low-light imaging and high-throughput research applications.
Sub-micron non-contact displacement measurement at up to 590 kHz A non-contact triangulation sensor family for high-speed displacement, position and thickness measurement.
High-frame-rate CMOS imaging for transient motion analysis A portfolio of high-speed CMOS cameras for recording fast transient events in scientific and industrial research.
5 kHz industrial color sensing with full-spectrum white illumination An industrial color sensor that combines full-spectrum white illumination with algorithmic color evaluation for difficult production environments.
High-speed inline 3D profiling with sub-micron precision A non-contact laser-triangulation sensor family that captures surface profiles, contours and 3D point clouds for inline measurement.
